DocumentCode
2035178
Title
The role of latency in the validity of AR simulation
Author
Lee, Cha ; Bonebrake, Scott ; Bowman, Doug A. ; Höllerer, Tobias
Author_Institution
Univ. of California, Santa Barbara, CA, USA
fYear
2010
fDate
20-24 March 2010
Firstpage
11
Lastpage
18
Abstract
It is extremely challenging to run controlled studies comparing multiple Augmented Reality (AR) systems. We use an AR simulation approach, in which a Virtual Reality (VR) system is used to simulate multiple AR systems. To investigate the validity of this approach, in our first experiment we carefully replicated a well-known study by Ellis et al. using our simulator, obtaining comparable results. We include a discussion on general issues we encountered with replicating a prior study. In our second experiment further exploring the validity of AR simulation, we investigated the effects of simulator latency on the results from experiments conducted in an AR simulator. We found simulator latency to have a significant effect on 3D tracing, however there was no interaction between simulator latency and artificial latency. Based on the results from these two experiments, we conclude that simulator latency is not inconsequential in determining task performance. Simulating visual registration is not sufficient to simulate the overall perception of registration errors in an AR system. We also need to keep simulator latency at a minimum. We discuss the impact of these results on the use of the AR simulation approach.
Keywords
augmented reality; simulation; 3D tracing; artificial latency; multiple augmented reality simulation; registration errors; simulator latency; virtual reality; Augmented reality; Computational modeling; Computer displays; Degradation; Delay; Graphics; Hardware; Jitter; Software performance; Virtual reality; I.3.6 [Methodology and Techniques]: Device independence-Replication; I.3.7 [Three-Dimensional Graphics and Realism]: Virtual Reality-AR Simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Virtual Reality Conference (VR), 2010 IEEE
Conference_Location
Waltham, MA
ISSN
1087-8270
Print_ISBN
978-1-4244-6237-7
Electronic_ISBN
1087-8270
Type
conf
DOI
10.1109/VR.2010.5444820
Filename
5444820
Link To Document