• DocumentCode
    2035550
  • Title

    Distributed mixed level logic and fault simulation on the Pentium(R)Pro microprocessor

  • Author

    Karthik, Sankaran ; Aitken, Mark ; Martin, Glidden ; Pappula, Srinivasu ; Stettler, Bob ; Vishakantaiah, Praveen ; Abreu, Manuel D. ; Abraham, Jacob A.

  • Author_Institution
    Nat. Semiconductor India (Pvt.) Ltd., India
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    160
  • Lastpage
    166
  • Abstract
    Logic and fault simulation are crucial steps in the design process for verifying the correctness of a circuit and generating high quality manufacturing tests. Traditionally, Intel has been relying on dedicated hardware accelerators to meet its fault grading needs. The unprecedented size and complexity of the Pentium(R)Pro microprocessor were foreseen to severely stretch the existing compute resources at Intel. Exploiting the design hierarchy and using the processing power of distributed computers were identified to be key areas which could alleviate the simulation problem. This paper describes a distributed mixed level logic and fault simulator that has been developed using an RTL simulation engine at the core, in conjunction with a gate level logic/fault simulator. The techniques and algorithm developed have been successfully applied on the Pentium(R)Pro microprocessor
  • Keywords
    VLSI; circuit analysis computing; distributed processing; fault diagnosis; logic CAD; logic testing; microprocessor chips; Intel; Pentium Pro microprocessor; RTL simulation engine; design hierarchy; design process; distributed computers; distributed mixed level logic/fault simulator; gate level logic/fault simulator; high quality manufacturing tests; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Logic circuits; Logic design; Logic testing; Manufacturing processes; Microprocessors; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.556958
  • Filename
    556958