• DocumentCode
    2035589
  • Title

    Removal of wire bond die using a three step process

  • Author

    Proietti-Brown, C.

  • Author_Institution
    Div. of Microelectron., IBM Corp., Poughkeepsie, NY
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    815
  • Lastpage
    819
  • Abstract
    The focus of this paper is the description of three processes that can be used for the removal of wirebond attached devices. The equipment described is relatively simple to install and can easily be used by manufacturing personnel. These cost effective methods of reworking this type of device are useful when multi-chip modules require repair after testing or where other defects have been found. Instead of discarding the module, a replacement can be made. Replacement procedures make effective use of engineering parts that may require changes. This is true for single chip modules as well
  • Keywords
    lead bonding; maintenance engineering; multichip modules; semiconductor device packaging; multi-chip modules; reworking; wire bond die; wirebond attached devices; Aluminum; Bonding; Costs; Fatigue; Gold; Manufacturing; Microelectronics; Personnel; Testing; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/94 International. Conference Proceedings. Combined Volumes.
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-2630-X
  • Type

    conf

  • DOI
    10.1109/ELECTR.1994.472643
  • Filename
    472643