Title :
Handling behavioral components in multi-level concurrent fault simulation
Author :
Lentz, Karen Panetta ; Homer, Jonathan B.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
Abstract :
System level modeling is becoming a necessity in all areas of engineering design. As systems grow in complexity, designers may increasingly rely on commercial off-the-shelf (COTS) components. Frequently, these components are described at a high level of abstraction (behaviorally) that complicates fault testing. We discuss the trade-offs of using behavioral components in a design, specifically as it relates to fault simulation. We investigate important issues such as timing, and examine the need to internally-fault behavioral models. We then present our fault-level concurrent fault simulator (MCS) that can accept any combination of gate level and behavioral models using a single kernel. Our kernel propagates faults through behavioral components deterministically. Finally, we present performance results of multi-level models to demonstrate the simulator´s capabilities and performance
Keywords :
circuit CAD; circuit simulation; circuit testing; digital simulation; fault simulation; timing; COTS components; behavioral component handling; commercial off-the-shelf components; engineering design; fault testing; gate level models; multilevel concurrent fault simulation; performance results; system level modeling; timing; Circuit faults; Circuit simulation; Computational modeling; Design engineering; Hardware design languages; Kernel; Logic devices; Microprocessors; Testing; Timing;
Conference_Titel :
Simulation Symposium, 2000. (SS 2000) Proceedings. 33rd Annual
Conference_Location :
Washington, DC
Print_ISBN :
0-7695-0598-8
DOI :
10.1109/SIMSYM.2000.844911