Title :
Introduction of recent SC65E activity for digital factory concept
Author :
Ikeda, Takashi ; Yamazaki, Hiroshi
Author_Institution :
IEC/SC65E Japanese Nat. Comm., Fuji Electr. Co. Ltd., Japan
Abstract :
The presentation introduces of the recent activity of IEC/SC65E toward realization of the digital factory concept. SC65E prepares international standards to specify digital representation of device properties and functions, methodologies and applications supporting automation of engineering processes, including diagnostic and maintenance techniques. The digital factory concept consists of standardized structure data and data base. Especially, activity of SC65E/WG2 will develop product properties and classification in process control devices and systems. Such structured properties will be based on the digital factory concept.
Keywords :
IEC standards; data structures; factory automation; maintenance engineering; process control; IEC/SC65E activity; device functions; device properties; diagnostic techniques; digital factory concept; digital representation; engineering process; international standards; maintenance techniques; process control devices; product classification; product properties; standardized database; standardized structure data; Automation; IEC standards; Maintenance engineering; Process control; Production facilities; Software; Virtual manufacturing; EDDL (Electronic Device Description Language); FDT (Field Device Tool); LOP (List of property); device profile; diagnostic; digital factory; function block; maintenance;
Conference_Titel :
SICE Annual Conference (SICE), 2011 Proceedings of
Conference_Location :
Tokyo
Print_ISBN :
978-1-4577-0714-8
