Introduction of recent SC65E activity for digital factory concept

Author

Ikeda, Takashi ; Yamazaki, Hiroshi

Author_Institution

IEC/SC65E Japanese Nat. Comm., Fuji Electr. Co. Ltd., Japan

fYear

2011

fDate

13-18 Sept. 2011

Firstpage

2054

Lastpage

2056

Abstract

The presentation introduces of the recent activity of IEC/SC65E toward realization of the digital factory concept. SC65E prepares international standards to specify digital representation of device properties and functions, methodologies and applications supporting automation of engineering processes, including diagnostic and maintenance techniques. The digital factory concept consists of standardized structure data and data base. Especially, activity of SC65E/WG2 will develop product properties and classification in process control devices and systems. Such structured properties will be based on the digital factory concept.

Keywords

IEC standards; data structures; factory automation; maintenance engineering; process control; IEC/SC65E activity; device functions; device properties; diagnostic techniques; digital factory concept; digital representation; engineering process; international standards; maintenance techniques; process control devices; product classification; product properties; standardized database; standardized structure data; Automation; IEC standards; Maintenance engineering; Process control; Production facilities; Software; Virtual manufacturing; EDDL (Electronic Device Description Language); FDT (Field Device Tool); LOP (List of property); device profile; diagnostic; digital factory; function block; maintenance;

fLanguage

English

Publisher

ieee

Conference_Titel

SICE Annual Conference (SICE), 2011 Proceedings of

Conference_Location

Tokyo

ISSN

pending

Print_ISBN

978-1-4577-0714-8

Type

conf

Filename

6060308