DocumentCode
2035829
Title
A new technique uses digital patterns to diagnose open pins
Author
Hamblin, Michael
Author_Institution
GenRad Inc., Concord, MA, USA
fYear
1994
fDate
10-12 May 1994
Firstpage
701
Lastpage
727
Abstract
This paper presents a recently implemented technique for diagnosing open pins on digital ICs in a board test environment. This technique is based on using software to generate adaptive patterns which cause the tester hardware to imitate faults on each IC pin, and determining if the imitated fault causes a change in device behavior. The software is described along with the issues affecting its design. The results of using the new technique are given, and the new technique is compared against other currently existing techniques
Keywords
digital integrated circuits; electronic engineering computing; integrated circuit testing; adaptive patterns; board test environment; device behavior; digital ICs; digital patterns; open pins; Capacitance measurement; Circuit faults; Dictionaries; Fault diagnosis; Lead; Packaging; Pins; Probes; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/94 International. Conference Proceedings. Combined Volumes.
Conference_Location
Boston, MA
Print_ISBN
0-7803-2630-X
Type
conf
DOI
10.1109/ELECTR.1994.472653
Filename
472653
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