A new technique uses digital patterns to diagnose open pins

This paper presents a recently implemented technique for diagnosing open pins on digital ICs in a board test environment. This technique is based on using software to generate adaptive patterns which cause the tester hardware to imitate faults on each IC pin, and determining if the imitated fault causes a change in device behavior. The software is described along with the issues affecting its design. The results of using the new technique are given, and the new technique is compared against other currently existing techniques