DocumentCode :
2036383
Title :
Characterization of silicon nanowires grown by electroless etching
Author :
Mertens, Robert G. ; Sundaram, Kalpathy B.
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Central Florida, Orlando, FL, USA
fYear :
2012
fDate :
15-18 March 2012
Firstpage :
1
Lastpage :
5
Abstract :
Silicon nanowires (SiNWs) were created using the electroless etching technique using silver nitrate (AgNO3)/hydrofluoric acid (HF) solution. More than 200 samples were created using various methods, concentrations and techniques, producing some consistent results and revealing some random properties. SEM images were taken of many samples, showing various stages of growth and the results of the various techniques used to grow the SiNWs. These images and experiments show that previous notions on the growth of SiNWs may be misunderstood. The experiments performed and the images taken show that SiNWs growth process is highly randomized, starting at the beginning of the etch with no SiNWs, and ending with SiNWs branching away from a centralized agglomeration made up of corrugated, ribbonized Silicon (Si). Process and SEM stage images are provided, including dendrite blankets.
Keywords :
dendrites; elemental semiconductors; etching; nanofabrication; nanowires; scanning electron microscopy; semiconductor growth; silicon; SEM image; agglomeration; dendrite blanket; electroless etching technique; silicon nanowire; Etching; Nanowires; Oxidation; Potential well; Silicon; Silver; Water;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Southeastcon, 2012 Proceedings of IEEE
Conference_Location :
Orlando, FL
ISSN :
1091-0050
Print_ISBN :
978-1-4673-1374-2
Type :
conf
DOI :
10.1109/SECon.2012.6196946
Filename :
6196946
Link To Document :
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