• DocumentCode
    2036636
  • Title

    Semi-intrusive quantification of uncertainties in stochastic electromagnetic interactions: Analysis of a spectral formulation

  • Author

    Sy, O.O. ; van Beurden, M.C. ; Michielsen, B.L. ; Tijhuis, A.G.

  • Author_Institution
    Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    552
  • Lastpage
    555
  • Abstract
    A stochastic approach is presented to statistically characterise uncertainties in electromagnetic interactions. A spectral definition of the observables allows for the assessment of the effect of a randomly deformed device independent of the incident field.
  • Keywords
    electromagnetic devices; random processes; spectral analysis; stochastic processes; random incident field; randomly deformed device independent; semiintrusive quantification; spectral formulation analysis; statistically characterise uncertainty; stochastic electromagnetic interaction; Computational electromagnetics; Deformable models; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic scattering; Page description languages; Spectral analysis; Stochastic processes; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
  • Conference_Location
    Torino
  • Print_ISBN
    978-1-4244-3385-8
  • Electronic_ISBN
    978-1-4244-3386-5
  • Type

    conf

  • DOI
    10.1109/ICEAA.2009.5297372
  • Filename
    5297372