Title :
Semi-intrusive quantification of uncertainties in stochastic electromagnetic interactions: Analysis of a spectral formulation
Author :
Sy, O.O. ; van Beurden, M.C. ; Michielsen, B.L. ; Tijhuis, A.G.
Author_Institution :
Dept. of Electr. Eng., Eindhoven Univ. of Technol., Eindhoven, Netherlands
Abstract :
A stochastic approach is presented to statistically characterise uncertainties in electromagnetic interactions. A spectral definition of the observables allows for the assessment of the effect of a randomly deformed device independent of the incident field.
Keywords :
electromagnetic devices; random processes; spectral analysis; stochastic processes; random incident field; randomly deformed device independent; semiintrusive quantification; spectral formulation analysis; statistically characterise uncertainty; stochastic electromagnetic interaction; Computational electromagnetics; Deformable models; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic scattering; Page description languages; Spectral analysis; Stochastic processes; Uncertainty; Voltage;
Conference_Titel :
Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-3385-8
Electronic_ISBN :
978-1-4244-3386-5
DOI :
10.1109/ICEAA.2009.5297372
