Title :
Image Quality Measure using Curvature Similarity
Author :
Yao, Susu ; Lin, W. ; Lu, Z.K. ; Ong, E.P. ; Locke, M.H. ; Wu, S.Q.
Author_Institution :
Inst. for Infocomm Res., Singapore
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
This paper proposes a new full-reference objective metric for image quality assessment. The reference and distorted images are decomposed into a number of wavelet subbands, in which mean curvatures and perceived error of the wavelet coefficients of two images are computed and integrated to give overall quality index. Taking structural similarity and error visibility into account, the new method can achieve high consistency with subjective evaluation compared with other metrics. Experimental results have shown the effectiveness of the proposed metric.
Keywords :
image processing; wavelet transforms; curvature similarity; full-reference objective metric; image distortion; image quality assessment; image quality measure; reference images; wavelet coefficients; Degradation; Distortion measurement; Eyes; Frequency; Humans; Image processing; Image quality; Surface texture; Wavelet coefficients; Wavelet transforms; Image quality assessment; correlation; error visibility; surface curvature; wavelet transform;
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2007.4379340