Title :
Lifetime and residual capacity estimate for Lithium-ion secondary cells for stationary use in telecommunications systems
Author :
Matsushima, Toshio ; Takagi, Shinya ; Muroyama, Seiichi ; Horie, Toshio
Author_Institution :
NTT Facilities, Tokyo
Abstract :
We estimated the lifetimes of large-capacity lithium-ion secondary cells in high-temperature-acceleration tests under variable maintaining voltages. The decrease in capacity was exacerbated by the temperature increase, and we found a strong correlation between the lifetime and temperature, in agreement with Arrhenius´ law. The lifetime, which was effected by the charge voltage, was over 10 years at 25degC, obtained by maintaining the cells at an appropriate charge voltage. The internal cell resistances were observed to increase in the tests and the increases were governed by the maintaining temperature. Charge voltages had little effect on the resistances. The residual capacity and internal resistance under a fixed charge voltage are correlated, and the internal resistance measurements might be useful for estimating residual capacities
Keywords :
lithium; secondary cells; telecommunication power supplies; 25 degC; Arrhenius law; high-temperature-acceleration tests; internal resistance; lifetime estimation; lithium-ion secondary cells; residual capacity estimation; telecommunications systems; Battery charge measurement; Cellular phones; Circuit testing; Electrical resistance measurement; Life estimation; Life testing; Lifetime estimation; System testing; Temperature; Voltage;
Conference_Titel :
Telecommunications Conference, 2005. INTELEC '05. Twenty-Seventh International
Conference_Location :
Berlin
Print_ISBN :
978-3-8007-2905-0
DOI :
10.1109/INTLEC.2005.335092