Title :
A Mutual Information Based Automatic Registration and Analysis Algorithm for Defect Identification in Printed Documents
Author :
Chandu, Kartheek ; Saber, Eli ; Wu, Wencheng
Author_Institution :
Rochester Inst. of Technol., Rochester
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
In this paper, we propose a defect analysis system, which automatically aligns a digitized copy of a printed output to a reference electronic original and subsequently illustrates potential image quality artifacts. We focus on image defects or artifacts caused by shortfalls in mechanical or electrophotographic processes. In this method, log-polar transform and mutual information techniques are used for image registration. A confidence map is then calculated by comparing the contrast and entropy of the neighborhood for each pixel in both images. This confidence map results in a qualitative difference between printed documents and electronic originals. The algorithm was demonstrated successfully on a database of 94 images with 95.7% accuracy.
Keywords :
image registration; image resolution; automatic image registration; defect identification; electronic originals; electrophotographic processes; image analysis algorithm; image quality artifacts; log-polar transform; mutual information techniques; printed documents; Algorithm design and analysis; Entropy; Hardware; Image analysis; Image color analysis; Image registration; Information analysis; Mutual information; Printers; Quality assurance; Automation; Image Analysis; Image Registration; Printers; Quality Assurance;
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2007.4379343