Multi Background Memory Testing

To coverage Pattern Sensitive Faults (PSF) the multiple run March test algorithms have been used. The key element of multiple run March test algorithms are memory backgrounds. In this paper the constructive algorithm for optimal set of memory backgrounds selection is proposed. The backgrounds selection it based on the binary vectors dissimilarity measures. The optimal solutions have been obtained for the cases of two, three and four runs memory testing. Theoretical and experimental analysis has been done which allow to prove the efficiency of proposed technique.