DocumentCode
2037203
Title
Deposition of TiN thin films using grid-assisting magnetron sputtering
Author
Jung, M.J. ; Kim, Y.M. ; Chung, Y.M. ; Han, Jing Ginger
Author_Institution
Center for Adv. Plasma Surface Technol., Sungkyunkwan Univ., Suwon, South Korea
fYear
2003
fDate
5-5 June 2003
Firstpage
415
Abstract
Summary form only given, as follows. It is well known that thin film growth and surface morphology can be substantially modified by ion-bombardment during the deposition. This is particularly important in case of thin-film deposition at low temperatures where the film growth occurs under highly nonequilibrium conditions. An attractive way to promote crystalline growth and surface morphology is deposition of additional energy into the surface of the growing film by bombardment with hyperthermal particles. We deposited crystalline Ti and TiN thin films on Si substrate by magnetron sputtering method with grid. Its thin films were highly smoothed and dense as increasing grid bias. In order explore the benefits of a bombardment of the growing film with high energetic particles, Ti and TiN films were deposited on Si substrates by an imbalanced magnetron sputter source with attached grid assembly for energetic ion extraction. Also, we have studied the variation of the plasma states for the feedback control of nucleation and growth behavior by Langmuir probe and Optical Emission Spectroscopy (OES). The epitaxial orientation, microstructual, optical characteristics and surface properties of the films were analyzed by XRD, SEM, ellipsometry and AFM.
Keywords
Langmuir probes; X-ray diffraction; atomic force microscopy; ellipsometry; nucleation; scanning electron microscopy; sputtered coatings; surface morphology; titanium compounds; visible spectra; AFM; Langmuir probe; SEM; Si substrate; TiN; TiN thin films; XRD; ellipsometry; epitaxial orientation; grid-assisting magnetron sputtering; growth behavior; highly nonequilibrium conditions; hyperthermal particles; ion-bombardment; microstructure; nucleation; optical characteristics; optical emission spectroscopy; surface morphology; surface properties; thin film growth; Crystallization; Optical feedback; Optical films; Particle beam optics; Semiconductor films; Sputtering; Stimulated emission; Substrates; Surface morphology; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location
Jeju, South Korea
ISSN
0730-9244
Print_ISBN
0-7803-7911-X
Type
conf
DOI
10.1109/PLASMA.2003.1229971
Filename
1229971
Link To Document