• DocumentCode
    2037343
  • Title

    On-chip tunable wide ranged multiple output voltage reference

  • Author

    Kapur, Garima ; Markan, C.M. ; Pyara, V.P.

  • Author_Institution
    VLSI Design Technol. Lab., Dayalbagh Educ. Inst., Agra, India
  • fYear
    2012
  • fDate
    15-18 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We presents an on-chip tunable wide ranged multiple output CMOS voltage reference based on non-volatile highly precise field programmable floating gate transistors. The reference is outfit for both sub 1V and above 1V applications. The circuit design consists of basic beta multiplier configuration and offers a strategy of making the current sourcing circuit and reference generating circuit as independent units. A simulation model of the circuit was built in T-Spice, 0.35μm CMOS process. Simulation results show high amount of temperature insensitivity for a large range of thermal conditions. The reference voltage variation is about 1.65mV/°C to 1.67mV/°C over wide temperature range of -40 to 140°C; has an impressive static supply dependency of 125μV/V for a reference of 280mV. The circuit can also be operated at very low supply voltage (0.5v).
  • Keywords
    CMOS integrated circuits; SPICE; circuit tuning; constant current sources; integrated circuit design; reference circuits; voltage multipliers; CMOS voltage reference; T-Spice; beta multiplier configuration; circuit design; current sourcing circuit; field programmable floating gate transistor; impressive static supply; on-chip tunability; reference generating circuit; simulation model; size 0.35 mum; temperature insensitivity; thermal condition; voltage 1 V; voltage 280 mV; CMOS integrated circuits; Programming; Resistors; Semiconductor device modeling; Temperature dependence; Threshold voltage; Transistors; Bets Multiplier; Field Programmable; Floating Gates; Multiple outputs; Voltage reference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon, 2012 Proceedings of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1091-0050
  • Print_ISBN
    978-1-4673-1374-2
  • Type

    conf

  • DOI
    10.1109/SECon.2012.6196981
  • Filename
    6196981