DocumentCode
20374
Title
Computation method for the short-term stability of quartz crystal resonators obtained from passive phase noise measures
Author
Sthal, F. ; Imbaud, J. ; Vacheret, X. ; Salzenstein, Patrice ; Cibiel, Gilles ; Galliou, S.
Author_Institution
Franche-Comte Electron. Mec. Thermique et Opt.-Sci. et Technol. (FEMTO-ST) Inst., Univ. of Franche-Comte, Besancon, France
Volume
60
Issue
7
fYear
2013
fDate
Jul-13
Firstpage
1530
Lastpage
1532
Abstract
The amplitude-frequency effect is a well-known phenomenon in quartz crystal resonators. It can distort the results of short-term stability measurements. In our case, results are computed from phase noise measurements in passive bridge systems. This article presents a method to correct computation of short-term stability from passive measurements.
Keywords
crystal resonators; phase noise; quartz; SiO2; amplitude-frequency effect; computation method; correct computation; passive bridge systems; passive phase noise measurement; quartz crystal resonators; short-term stability measurements;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2013.2725
Filename
6552403
Link To Document