DocumentCode :
20374
Title :
Computation method for the short-term stability of quartz crystal resonators obtained from passive phase noise measures
Author :
Sthal, F. ; Imbaud, J. ; Vacheret, X. ; Salzenstein, Patrice ; Cibiel, Gilles ; Galliou, S.
Author_Institution :
Franche-Comte Electron. Mec. Thermique et Opt.-Sci. et Technol. (FEMTO-ST) Inst., Univ. of Franche-Comte, Besancon, France
Volume :
60
Issue :
7
fYear :
2013
fDate :
Jul-13
Firstpage :
1530
Lastpage :
1532
Abstract :
The amplitude-frequency effect is a well-known phenomenon in quartz crystal resonators. It can distort the results of short-term stability measurements. In our case, results are computed from phase noise measurements in passive bridge systems. This article presents a method to correct computation of short-term stability from passive measurements.
Keywords :
crystal resonators; phase noise; quartz; SiO2; amplitude-frequency effect; computation method; correct computation; passive bridge systems; passive phase noise measurement; quartz crystal resonators; short-term stability measurements;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2013.2725
Filename :
6552403
Link To Document :
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