DocumentCode :
2037677
Title :
A power-gatable reconfigurable logic chip with FeRAM cells
Author :
Koga, Masahiro ; Iida, Masahiro ; Amagasaki, Motoki ; Ichida, Yoshinobu ; Saji, Mari ; Iida, Jun ; Sueyoshi, Toshinori
Author_Institution :
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
fYear :
2010
fDate :
21-24 Nov. 2010
Firstpage :
317
Lastpage :
322
Abstract :
An advantage of a RLD (Reconfigurable logic device) such as an FPGA (Field programmable gate array) is that it can be customized after being manufactured. However, there is a problem related to standby power when using SRAM as a configuration memory. Power gating, which is one of the power reduction techniques, is difficult to use in SRAM-based RLDs because of the high overhead - data hibernation and reconfiguration time - and SRAM being volatile. In this paper, we describe a chip that we developed - a reconfigurable logic chip based on FeRAM (Ferroelectric random access memory) technology. The chip employs island-style routing architecture and uses a variable grain logic cell as a logic block. A NV-FF (Non-Volatile FlipFlop), which contains FeRAM, a FF, and power-gating control circuits, is used as configuration memory. The NV-FF can transmit data between FeRAM and FF automatically when power to the chip is turned off/on. Thus, chip-level power gating is possible. The hibernate/restore time is less than I ms. The chip has 18 × 18 logic blocks and an area of 54.76 mm2. We also make test circuits for testing the chip after fabrication. Target fault model is Stack-at faults model. When we merge all 28 circuits, fault coverage is 78%.
Keywords :
SRAM chips; fault diagnosis; ferroelectric storage; field programmable gate arrays; flip-flops; FPGA; FeRAM cells; RLD; SRAM; Stack-at fault model; chip-level power gating; data hibernation; ferroelectric random access memory technology; field programmable gate array; island-style routing architecture; nonvolatile flipflop; power reduction techniques; power-gatable reconfigurable logic chip; power-gating control circuits; reconfigurable logic device; variable grain logic cell;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2010 - 2010 IEEE Region 10 Conference
Conference_Location :
Fukuoka
ISSN :
pending
Print_ISBN :
978-1-4244-6889-8
Type :
conf
DOI :
10.1109/TENCON.2010.5686019
Filename :
5686019
Link To Document :
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