• DocumentCode
    2037957
  • Title

    Calculation of characteristic impedance of transmission lines with substrate integrated artificial dielectric structures

  • Author

    Lim, Jongsik ; Lee, Jun ; Lee, Jaehoon ; Jeong, Yongchae ; Han, Sang-Min ; Choi, Kwan-Sun ; Ahn, Dal

  • Author_Institution
    SoonChunHyang Univ., Asan, South Korea
  • fYear
    2010
  • fDate
    21-24 Nov. 2010
  • Firstpage
    1632
  • Lastpage
    1635
  • Abstract
    A calculation method for the characteristic impedance of transmission lines with any perturbation structure is proposed. An analytical procedure is described with proper equations based on simple transmission line theories. The obtained characteristic impedance by the proposed method shows an almost constant value, while it fluctuates severely depending on the frequency in the conventional method. As a sample transmission line element, a microstrip line with the substrate integrated artificial dielectric (SIAD) structure is selected for calculating the characteristic impedance by the proposed method. The calculated characteristic impedances from the simulated and measured S-parameters well converge to a constant value without fluctuation.
  • Keywords
    microstrip lines; transmission lines; S-parameters; perturbation structure; simple transmission line theory; substrate integrated artificial dielectric structure; substrate integrated artificial dielectric structures; transmission line impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2010 - 2010 IEEE Region 10 Conference
  • Conference_Location
    Fukuoka
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-6889-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2010.5686031
  • Filename
    5686031