• DocumentCode
    2038028
  • Title

    A Markov random field for rectilinear structure extraction in pavement distress image analysis

  • Author

    Delagnes, Philippe ; Barba, Dominique

  • Author_Institution
    SEI-IRESTE, Nantes, France
  • Volume
    1
  • fYear
    1995
  • fDate
    23-26 Oct 1995
  • Firstpage
    446
  • Abstract
    This paper deals with the detection and extraction of poorly contrasted rectilinear structures in textured areas, using a Markov random field model. The application is in the analysis of pavement distress, and more particularly pavement cracks. A local crack detection is first performed, where the pavement texture is seen as additive correlated noise. The resulting line image is then projected onto a regular lattice composed of straight line segments. A graph structure is associated with this lattice, which allows the definition of a Markovian crack model, where sites are no longer the image pixels, but straight line segments. The model is used to determine the location and shape of the rectilinear structures, with a given orientation, in the observed lattice. The actual defects can then be extracted by simple post-processing
  • Keywords
    Markov processes; crack detection; edge detection; feature extraction; image segmentation; image texture; Markov random field model; Markovian crack model; additive correlated noise; graph structure; image pixels; image segmentation; line image; local crack detection; observed lattice; orientation; pavement cracks; pavement distress image analysis; pavement texture; postprocessing; rectilinear structure detection; rectilinear structure extraction; rectilinear structure location; rectilinear structure shape; regular lattice; straight line segments; Additive noise; Cameras; Image analysis; Image segmentation; Image texture analysis; Lattices; Markov random fields; Pixel; Roads; Surface cracks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 1995. Proceedings., International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-8186-7310-9
  • Type

    conf

  • DOI
    10.1109/ICIP.1995.529742
  • Filename
    529742