DocumentCode
2038214
Title
MoM/BI-RME modeling of frequency selective surfaces with thick metal patches
Author
Bozzi, Maurizio ; Montagna, Maria ; Perregrini, Luca
Author_Institution
Dipt. di Elettron., Univ. di Pavia, Pavia, Italy
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
327
Lastpage
330
Abstract
This paper presents a novel technique for the modeling of capacitive frequency selective surfaces (FSS) with thick metal patches. While these structures are typically analyzed under the hypothesis of infinitely thin metal patches, taking into account the finite thickness of the patches is important in the mm- and submm-wave frequency band, where patches are electrically thick and the thin-patch approximation leads to a shift of the resonance frequency. In addition, the proposed approach permits a better evaluation of conductor losses. The proposed technique is based on the MoM/BI-RME method and permits a computationally efficient and accurate modeling of thick-patch FSS. A validation example is reported and compared to the results obtained with a commercial software, in order to demonstrate the accuracy of the proposed method.
Keywords
frequency selective surfaces; losses; method of moments; MoM/BI-RME method; MoM/BI-RME modeling; boundary integral-resonant mode expansion; capacitive frequency selective surfaces; conductor losses; electrically thick approximation; infinitely thin metal patches; patch finite thickness; resonance frequency; submm-wave frequency band; thick metal patches; thin-patch approximation; Conductors; Current density; Filters; Frequency selective surfaces; Integral equations; Mirrors; Periodic structures; Resonance; Resonant frequency; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
Conference_Location
Torino
Print_ISBN
978-1-4244-3385-8
Electronic_ISBN
978-1-4244-3386-5
Type
conf
DOI
10.1109/ICEAA.2009.5297426
Filename
5297426
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