• DocumentCode
    2038214
  • Title

    MoM/BI-RME modeling of frequency selective surfaces with thick metal patches

  • Author

    Bozzi, Maurizio ; Montagna, Maria ; Perregrini, Luca

  • Author_Institution
    Dipt. di Elettron., Univ. di Pavia, Pavia, Italy
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    327
  • Lastpage
    330
  • Abstract
    This paper presents a novel technique for the modeling of capacitive frequency selective surfaces (FSS) with thick metal patches. While these structures are typically analyzed under the hypothesis of infinitely thin metal patches, taking into account the finite thickness of the patches is important in the mm- and submm-wave frequency band, where patches are electrically thick and the thin-patch approximation leads to a shift of the resonance frequency. In addition, the proposed approach permits a better evaluation of conductor losses. The proposed technique is based on the MoM/BI-RME method and permits a computationally efficient and accurate modeling of thick-patch FSS. A validation example is reported and compared to the results obtained with a commercial software, in order to demonstrate the accuracy of the proposed method.
  • Keywords
    frequency selective surfaces; losses; method of moments; MoM/BI-RME method; MoM/BI-RME modeling; boundary integral-resonant mode expansion; capacitive frequency selective surfaces; conductor losses; electrically thick approximation; infinitely thin metal patches; patch finite thickness; resonance frequency; submm-wave frequency band; thick metal patches; thin-patch approximation; Conductors; Current density; Filters; Frequency selective surfaces; Integral equations; Mirrors; Periodic structures; Resonance; Resonant frequency; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
  • Conference_Location
    Torino
  • Print_ISBN
    978-1-4244-3385-8
  • Electronic_ISBN
    978-1-4244-3386-5
  • Type

    conf

  • DOI
    10.1109/ICEAA.2009.5297426
  • Filename
    5297426