DocumentCode :
2038214
Title :
MoM/BI-RME modeling of frequency selective surfaces with thick metal patches
Author :
Bozzi, Maurizio ; Montagna, Maria ; Perregrini, Luca
Author_Institution :
Dipt. di Elettron., Univ. di Pavia, Pavia, Italy
fYear :
2009
fDate :
14-18 Sept. 2009
Firstpage :
327
Lastpage :
330
Abstract :
This paper presents a novel technique for the modeling of capacitive frequency selective surfaces (FSS) with thick metal patches. While these structures are typically analyzed under the hypothesis of infinitely thin metal patches, taking into account the finite thickness of the patches is important in the mm- and submm-wave frequency band, where patches are electrically thick and the thin-patch approximation leads to a shift of the resonance frequency. In addition, the proposed approach permits a better evaluation of conductor losses. The proposed technique is based on the MoM/BI-RME method and permits a computationally efficient and accurate modeling of thick-patch FSS. A validation example is reported and compared to the results obtained with a commercial software, in order to demonstrate the accuracy of the proposed method.
Keywords :
frequency selective surfaces; losses; method of moments; MoM/BI-RME method; MoM/BI-RME modeling; boundary integral-resonant mode expansion; capacitive frequency selective surfaces; conductor losses; electrically thick approximation; infinitely thin metal patches; patch finite thickness; resonance frequency; submm-wave frequency band; thick metal patches; thin-patch approximation; Conductors; Current density; Filters; Frequency selective surfaces; Integral equations; Mirrors; Periodic structures; Resonance; Resonant frequency; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-3385-8
Electronic_ISBN :
978-1-4244-3386-5
Type :
conf
DOI :
10.1109/ICEAA.2009.5297426
Filename :
5297426
Link To Document :
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