Title :
Burn-in elimination of a high volume microprocessor using IDDQ
Author :
Henry, Timothy R. ; Soo, Thomas
Author_Institution :
Div. of Comput. Enhancement, Intel Corp., Chandler, AZ, USA
Abstract :
For many years at this conference and others, IDDQ has been a subject of much controversy involving its ability to enhance production test. While standard industry methods such as stuck-at functional testing and scan based testing are largely accepted by the global test community, IDDQ testing continues to spark debate in the industry. This paper shows that IDDQ testing is not only beneficial to production test, but also enabled the i960RJX Microprocessor to ZOBI the standard production flow. ZOBI is an internal Intel term meaning `Zero Hour Burn In´ which will be explained further in a later section. This paper details the methodology employed for IDDQ vector selection, tester manipulation, program flow, limits selection, and production qualification. The effect of IDDQ on burn-in elimination and outgoing quality is demonstrated
Keywords :
CMOS digital integrated circuits; computer testing; electric current measurement; integrated circuit testing; production testing; 32 bit; CMOS; IDDQ; Intel; ZOBI; Zero Hour Burn In; burn-in elimination; high volume microprocessor; limits selection; production qualification; production test; program flow; standard industry; tester manipulation; vector selection; Circuit faults; Circuit testing; Clocks; Computational modeling; Current supplies; Hardware; Integrated circuit testing; Leak detection; Microprocessors; Switches;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556968