DocumentCode :
2038315
Title :
Software Test Selection Patterns and Elusive Bugs
Author :
Howden, William E.
Author_Institution :
University of California at San Diego
Volume :
1
fYear :
2005
fDate :
26-28 July 2005
Firstpage :
25
Lastpage :
32
Abstract :
Traditional white and black box testing methods are effective in revealing many kinds of defects, but the more elusive bugs slip past them. Model-based testing incorporates additional application concepts in the selection of tests, which may provide more refined bug detection, but does not go far enough. Test selection patterns identify defect-oriented contexts in a program. They also identify suggested tests for risks associated with a specified context. A context and its risks is a kind of conceptual trap designed to corner a bug. The suggested tests will find the bug if it has been caught in the trap.
Keywords :
Testing; defects; design; elusive; models; patterns; Application software; Automatic testing; Computer applications; Computer bugs; Design methodology; Genetic mutations; Glass; Performance evaluation; Software testing; System testing; Testing; defects; design; elusive; models; patterns;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference, 2005. COMPSAC 2005. 29th Annual International
ISSN :
0730-3157
Print_ISBN :
0-7695-2413-3
Type :
conf
DOI :
10.1109/COMPSAC.2005.143
Filename :
1509993
Link To Document :
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