DocumentCode :
2038386
Title :
Consideration of impact of GaN HEMT for class E amplifier
Author :
Uchiyama, Hiroyuki ; Yamamoto, Ryuta ; Ishikawa, Yusuke ; Suetsugu, Tadashi
Author_Institution :
Dept. of Electron. Eng. & Comput. Sci., Fukuoka Univ., Fukuoka, Japan
fYear :
2010
fDate :
21-24 Nov. 2010
Firstpage :
1780
Lastpage :
1783
Abstract :
This paper demonstrates GaN HEMT as the transistor switch for 13.56 MHz class E amplifier. It is shown that GaN HEMT has capability of realizing very high efficiency class E amplifier at higher frequency than Silicon MOSFETs. Problem of negative threshold voltage, i.e., "normally on" characteristics, is considered. It is considered using second voltage supply, GaN HEMT can be driven properly. Experimental demonstration of 13.56 MHz 1 W class E amplifier achieved 82% efficiency.
Keywords :
III-V semiconductors; MOSFET; gallium compounds; high electron mobility transistors; GaN; GaN HEMT; class E amplifier; efficiency 82 percent; frequency 13.56 MHz; negative threshold voltage; power 1 W; silicon MOSFET; transistor switch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2010 - 2010 IEEE Region 10 Conference
Conference_Location :
Fukuoka
ISSN :
pending
Print_ISBN :
978-1-4244-6889-8
Type :
conf
DOI :
10.1109/TENCON.2010.5686052
Filename :
5686052
Link To Document :
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