• DocumentCode
    2038429
  • Title

    Techniques of improved signal extraction in scan conversion-based transient digitizers

  • Author

    Arpaia, P. ; Baccigalupi, A. ; Cennamo, F.

  • Author_Institution
    Dipartimento di Ingegneria Elettrica, Naples Univ., Italy
  • Volume
    2
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    860
  • Abstract
    The paper deals with a technique to improve the signal extraction from the target of scan conversion-based transient digitizers. At first, the statistical parameters of the digitized charge distribution on each target column are analyzed. Then the statistical parameter trend across the target is evaluated. Finally, the identification of the distribution charge model allows the signal extraction to be improved. Experimental results of tests carried out on an actual scan converter using dc and sinewave signals showed that signal extraction can be improved mostly by correcting the center displacement of the column distributions
  • Keywords
    analogue-digital conversion; computerised instrumentation; electric distortion; statistical analysis; transient analysers; center displacement; column distributions; digitized charge distribution; distribution charge model; identification; improved signal extraction; scan conversion; semiconductor diodes; signal extraction; sinewave signals; statistical parameter; statistical parameters; target column; transient digitizers; Charge measurement; Current measurement; Distortion measurement; Electron beams; Semiconductor diodes; Signal analysis; Signal processing; Testing; Vision defects; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
  • Conference_Location
    Brussels
  • Print_ISBN
    0-7803-3312-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1996.507290
  • Filename
    507290