DocumentCode :
2038429
Title :
Techniques of improved signal extraction in scan conversion-based transient digitizers
Author :
Arpaia, P. ; Baccigalupi, A. ; Cennamo, F.
Author_Institution :
Dipartimento di Ingegneria Elettrica, Naples Univ., Italy
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
860
Abstract :
The paper deals with a technique to improve the signal extraction from the target of scan conversion-based transient digitizers. At first, the statistical parameters of the digitized charge distribution on each target column are analyzed. Then the statistical parameter trend across the target is evaluated. Finally, the identification of the distribution charge model allows the signal extraction to be improved. Experimental results of tests carried out on an actual scan converter using dc and sinewave signals showed that signal extraction can be improved mostly by correcting the center displacement of the column distributions
Keywords :
analogue-digital conversion; computerised instrumentation; electric distortion; statistical analysis; transient analysers; center displacement; column distributions; digitized charge distribution; distribution charge model; identification; improved signal extraction; scan conversion; semiconductor diodes; signal extraction; sinewave signals; statistical parameter; statistical parameters; target column; transient digitizers; Charge measurement; Current measurement; Distortion measurement; Electron beams; Semiconductor diodes; Signal analysis; Signal processing; Testing; Vision defects; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507290
Filename :
507290
Link To Document :
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