IDDQ and AC scan: the war against unmodelled defects

Author

Maxwell, Peter C. ; Aitken, Robert C. ; Kollitz, Kathleen R. ; Brown, Allen C.

Author_Institution

Integrated Circuit Bus. Div., Hewlett-Packard Co., USA

fYear

1996

fDate

20-25 Oct 1996

Firstpage

250

Lastpage

258

Abstract

This paper investigates the relative effectiveness of scan-based AC tests, IDDQ tests and functional tests for the detection of defective chips, particularly those exhibiting delay faults. Data are presented from an experiment in which a production ASIC was tested with a number of scan and functional tests, together with IDDQ. Results show that all tests detect unique failures, indicating the presence of additional unmodelled faults. The effectiveness of the AC tests shows that targeting additional faults produces better quality than relying on peripheral coverage of existing tests

Keywords

CMOS integrated circuits; application specific integrated circuits; delays; electric current measurement; fault diagnosis; integrated circuit testing; logic testing; AC scan; AC tests; ASIC; IDDQ; defective chips; delay faults; effectiveness; fault models; functional tests; relative effectiveness; unique failures; unmodelled defects; unmodelled faults; Application specific integrated circuits; Circuit faults; Circuit testing; Companies; Delay; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Production;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.556969

Filename

556969