Title :
IDDQ and AC scan: the war against unmodelled defects
Author :
Maxwell, Peter C. ; Aitken, Robert C. ; Kollitz, Kathleen R. ; Brown, Allen C.
Author_Institution :
Integrated Circuit Bus. Div., Hewlett-Packard Co., USA
Abstract :
This paper investigates the relative effectiveness of scan-based AC tests, IDDQ tests and functional tests for the detection of defective chips, particularly those exhibiting delay faults. Data are presented from an experiment in which a production ASIC was tested with a number of scan and functional tests, together with IDDQ. Results show that all tests detect unique failures, indicating the presence of additional unmodelled faults. The effectiveness of the AC tests shows that targeting additional faults produces better quality than relying on peripheral coverage of existing tests
Keywords :
CMOS integrated circuits; application specific integrated circuits; delays; electric current measurement; fault diagnosis; integrated circuit testing; logic testing; AC scan; AC tests; ASIC; IDDQ; defective chips; delay faults; effectiveness; fault models; functional tests; relative effectiveness; unique failures; unmodelled defects; unmodelled faults; Application specific integrated circuits; Circuit faults; Circuit testing; Companies; Delay; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Production;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556969
