Title :
Computer-aided design on the VLSI 45/spl deg/-mask compaction
Author :
Feng, W.S. ; Yang, W.T. ; Hsieh, M.Y.
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
We combine 1D compaction with reshaping-a new action to improve the result of the compaction. Our algorithms change layout element shapes automatically according to some criteria and make neighboring layout element shapes as similar as possible. The more similar they are, the more compactable space we can obtain. The main part of our compaction is reshaping. If elements of a certain 45/spl deg/ layout can have their geometric shapes reassigned, we reshape them in order to gain a more compactable space. Some experimental results of this 45/spl deg/ compactor with and without reshaping of both Manhattan and nonManhattan 45/spl deg/ layouts are shown.<>
Keywords :
VLSI; circuit layout CAD; masks; 1D compaction; 45 degree mask compaction; Manhattan layouts; VLSI; computer-aided design; geometric shape reassignment; layout element shape changing; neighboring layout element shapes; nonManhattan layouts; reshaping; Chip scale packaging; Compaction; Data mining; Data structures; Design automation; NP-complete problem; Shape; Tiles; Turning; Very large scale integration;
Conference_Titel :
TENCON '93. Proceedings. Computer, Communication, Control and Power Engineering.1993 IEEE Region 10 Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-1233-3
DOI :
10.1109/TENCON.1993.320078