Title :
Genetic & Evolutionary Biometrics: Feature extraction from a Machine Learning perspective
Author :
Shelton, Joseph ; Alford, A. ; Small, L. ; Leflore, Derrick ; Williams, Julia ; Adams, J. ; Dozier, Gerry ; Bryant, K. ; Abegaz, T. ; Ricanek, Karl
Author_Institution :
Center for Adv. Studies in Identity Sci., NC A&T, Greensboro, NC, USA
Abstract :
Genetic & Evolutionary Biometrics (GEB) is a newly emerging area of study devoted to the design, analysis, and application of genetic and evolutionary computing to the field of biometrics. In this paper, we present a GEB application called GEFEML (Genetic and Evolutionary Feature Extraction - Machine Learning). GEFEML incorporates a machine learning technique, referred to as cross validation, in an effort to evolve a population of local binary pattern feature extractors (FEs) that generalize well to unseen subjects. GEFEML was trained on a dataset taken from the FRGC database and generalized well on two test sets of unseen subjects taken from the FRGC and MORPH databases. GEFEML evolved FEs that used fewer patches, had comparable accuracy, and were 54% less expensive in terms of computational complexity.
Keywords :
biometrics (access control); computational complexity; feature extraction; genetic algorithms; learning (artificial intelligence); FRGC database; GEB; GEFEML; MORPH database; computational complexity; cross validation; evolutionary computing application; genetic & evolutionary biometric; genetic and evolutionary feature extraction-machine learning; genetic computing application; local binary pattern FE; local binary pattern feature extractor; Complexity theory; FETs; Iron; Optimization; Vectors; Biometrics; Cross Validation; Estimation of Distribution Algorithm; Feature Extraction; Genetic & Evolutionary Computation; Local Binary Pattern;
Conference_Titel :
Southeastcon, 2012 Proceedings of IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-1374-2
DOI :
10.1109/SECon.2012.6197069