• DocumentCode
    2039307
  • Title

    Genetic & Evolutionary Biometrics: Feature extraction from a Machine Learning perspective

  • Author

    Shelton, Joseph ; Alford, A. ; Small, L. ; Leflore, Derrick ; Williams, Julia ; Adams, J. ; Dozier, Gerry ; Bryant, K. ; Abegaz, T. ; Ricanek, Karl

  • Author_Institution
    Center for Adv. Studies in Identity Sci., NC A&T, Greensboro, NC, USA
  • fYear
    2012
  • fDate
    15-18 March 2012
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Genetic & Evolutionary Biometrics (GEB) is a newly emerging area of study devoted to the design, analysis, and application of genetic and evolutionary computing to the field of biometrics. In this paper, we present a GEB application called GEFEML (Genetic and Evolutionary Feature Extraction - Machine Learning). GEFEML incorporates a machine learning technique, referred to as cross validation, in an effort to evolve a population of local binary pattern feature extractors (FEs) that generalize well to unseen subjects. GEFEML was trained on a dataset taken from the FRGC database and generalized well on two test sets of unseen subjects taken from the FRGC and MORPH databases. GEFEML evolved FEs that used fewer patches, had comparable accuracy, and were 54% less expensive in terms of computational complexity.
  • Keywords
    biometrics (access control); computational complexity; feature extraction; genetic algorithms; learning (artificial intelligence); FRGC database; GEB; GEFEML; MORPH database; computational complexity; cross validation; evolutionary computing application; genetic & evolutionary biometric; genetic and evolutionary feature extraction-machine learning; genetic computing application; local binary pattern FE; local binary pattern feature extractor; Complexity theory; FETs; Iron; Optimization; Vectors; Biometrics; Cross Validation; Estimation of Distribution Algorithm; Feature Extraction; Genetic & Evolutionary Computation; Local Binary Pattern;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon, 2012 Proceedings of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1091-0050
  • Print_ISBN
    978-1-4673-1374-2
  • Type

    conf

  • DOI
    10.1109/SECon.2012.6197069
  • Filename
    6197069