DocumentCode :
2039429
Title :
An exact non-enumerative fault simulator for path-delay faults
Author :
Gharaybeh, Marwan A. ; Bushnell, Michael L. ; Agrawal, Vishwani D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
fYear :
1996
fDate :
20-25 Oct 1996
Firstpage :
276
Lastpage :
285
Abstract :
The present an efficient path-delay fault (PDF) simulator that does not involve enumeration of paths. Our method calculates the exact fault coverage, and identifies all tested faults in any circuit with a large number of paths. We present a new data structure, called the Path-Status Graph (PSG), to efficiently hold the status of each PDP in the circuit, i.e., whether or not the PDF is tested. The key to this efficiency is in breaking the information into pieces and distributing it over the data structure and in retaining all or part of the reconverging fanout structure of the circuit in the PSG. Thus, an exponential number of PDFs can share the same piece of information. Using one thousand random tests, we simulated all of the approximately 1020 PDFs in the circuit c6288 and determined that 4.4 billion faults were detected. This number is larger by over three orders of magnitude compared to what was possible with previously reported methods
Keywords :
circuit analysis computing; fault diagnosis; integrated circuit modelling; integrated circuit testing; integrated logic circuits; logic testing; random processes; Path-Status Graph; algorithm validation; combinational circuit; data structure; exponential number; fanout structure; non-enumerative fault simulator; path-delay faults; random tests; status invariant transformations; tested faults; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Delay; Electrical fault detection; Fault detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-3541-4
Type :
conf
DOI :
10.1109/TEST.1996.556972
Filename :
556972
Link To Document :
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