DocumentCode :
2039553
Title :
Simulation of Via Interconnects Using Physics-Based Models and Microwave Network Parameters
Author :
Rimolo-Donadio, Renato ; Stepan, Andrzej J. ; Bruns, Heinz-Dietrich ; Drewniak, James L. ; Schuster, Christian
Author_Institution :
Inst. fur Theor. Elektrotechnik, Tech. Univ. of Hamburg-Harburg, Hamburg
fYear :
2008
fDate :
12-15 May 2008
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, the simulation of via interconnects in multilayered printed circuit boards (PCBs) and packages combining physics-based via models and microwave network theory will be discussed. The description of the via in terms of network parameters, partitioning of the system, and combination of partial results will be addressed. Two alternatives to combine the results are compared, namely multiplication of ABCD matrices and the segmentation method based on S-parameters. The goal of this work is to develop a fast and accurate modeling strategy for via arrays in the multi-gigabit range, extensible to an arbitrary number of elements, and suitable for automation and design optimization. The obtained results show good agreement with respect to 3D electromagnetic field simulations and measurements up to 20 GHz. Hence, this approach is a promising technique for efficient system-level simulation of interconnects.
Keywords :
S-parameters; integrated circuit interconnections; integrated circuit modelling; microwave integrated circuits; printed circuit design; 3D electromagnetic field simulations; S-parameters; design optimization; microwave network parameters; microwave network theory; multilayered printed circuit boards; physics-based via models; system-level simulation; via arrays; via interconnect simulation; Circuit simulation; Design automation; Design optimization; Electromagnetic fields; Integrated circuit interconnections; Microwave theory and techniques; Packaging; Printed circuits; Scattering parameters; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
Conference_Location :
Avignon
Print_ISBN :
978-1-4244-2317-0
Electronic_ISBN :
978-1-4244-2318-7
Type :
conf
DOI :
10.1109/SPI.2008.4558352
Filename :
4558352
Link To Document :
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