Title :
Nanostructured Materials Studied by Means of the Computed Field Ion Image Tomography (CFIIT)
Author :
Wille, Catharina ; Al-Kassab, Talaát ; Heinrich, Alexander ; Kirchheim, Reiner
Author_Institution :
Institut fuer Materialphysik, Gottingen Univ.
Abstract :
A new technique for transmission electron microscopy and atom probe tomography of nanocrystalline materials is developed based on field ion microscopy (FIM). The computed field ion image tomography (cFIIT) uses stacked field ion micrographs to reconstruct volumes 102 to 103 times larger than those from tomographic atom probe. This method also makes it possible to create "virtual" FIM images in order to visualise nanoscopic microstructures and provides orientation information to obtain the distances between grain boundary precipitates
Keywords :
atom probe field ion microscopy; cobalt; copper; crystal microstructure; grain boundary segregation; nanostructured materials; nickel; transmission electron microscopy; Cu:Co; Ni; atom probe tomography; cFIIT; computed field ion image tomography; field ion microscopy; grain boundary precipitates; microstructures; nanostructured materials; transmission electron microscopy; virtual FIM images; Brightness; Chemical analysis; Grain size; Image analysis; Information analysis; Morphology; Nanostructured materials; Nanostructures; Tomography; Voltage;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335312
