• DocumentCode
    2039923
  • Title

    Hereditary trends in parent and offspring fingerprint classes

  • Author

    Obaje, Samuel Enemakwu

  • Author_Institution
    Comput. Eng. Dept., Fed. Polytech., Offa, Nigeria
  • Volume
    3
  • fYear
    2011
  • fDate
    8-10 April 2011
  • Firstpage
    475
  • Lastpage
    478
  • Abstract
    The global patterns on any fingerprint fall into one of the six common classes; arch, tented arch, double loop, left loop, right loop, and whorl. Though these groupings are not sufficient to effect personal identification but they can be used for group search localization and correlation. 800 fingerprints from 10 fingers of 20 families; Father, Mother, a male child and a female were used for the experiment. Analysis was carried out to determine the level of correlation among fingerprints of parents and their children. The analysis was strictly based on the class group localization and not the minutiae details therein. The test revealed that the children fingerprint class pattern was borne out of combination of class patterns found on both parents. Also whenever there was close relation between parents fingerprint classes, the child - child classes are found to be very close. Based on the result of the analysis, it is possible therefore, to ascertain the true parents of a child by comparing their fingerprint classes rather than going through the trouble of DNA analysis.
  • Keywords
    fingerprint identification; class group localization; group search localization; hereditary trends; offspring fingerprint class; parent fingerprint class; personal identification; Correlation; DNA; Face; Fingerprint recognition; Fingers; Pediatrics; Adoption; Biological; Correlation; DNA-Deoxyribonucleic acid;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Computer Technology (ICECT), 2011 3rd International Conference on
  • Conference_Location
    Kanyakumari
  • Print_ISBN
    978-1-4244-8678-6
  • Electronic_ISBN
    978-1-4244-8679-3
  • Type

    conf

  • DOI
    10.1109/ICECTECH.2011.5941837
  • Filename
    5941837