• DocumentCode
    2040075
  • Title

    Observation of electron wave interference in field emission from two adjacent different points

  • Author

    Murakami, K. ; Wakaya, F. ; Takai, M.

  • Author_Institution
    Center for Quantum Sci. & Technol. under Extreme Conditions, Osaka Univ.
  • fYear
    2006
  • fDate
    38899
  • Firstpage
    37
  • Lastpage
    38
  • Abstract
    A Pt field emitter with two adjacent emission sites was fabricated by electron-beam induced deposition (EBID). The interference of electron waves in field emission from artificially fabricated two different points was observed for the first time. The observed interference fringes were well reproduced by the Young´s interference. These results draw a possibility of the new devices based on the interference of the coherent electrons in vacuum
  • Keywords
    electron beam deposition; electron field emission; platinum; Pt; electron wave interference; electron-beam induced deposition; field emission; field emitter; interference fringes; Annealing; Apertures; Carbon dioxide; Electromagnetic interference; Electron beams; Electron emission; Electron microscopy; Holography; Scanning electron microscopy; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335322
  • Filename
    4134447