DocumentCode :
2040075
Title :
Observation of electron wave interference in field emission from two adjacent different points
Author :
Murakami, K. ; Wakaya, F. ; Takai, M.
Author_Institution :
Center for Quantum Sci. & Technol. under Extreme Conditions, Osaka Univ.
fYear :
2006
fDate :
38899
Firstpage :
37
Lastpage :
38
Abstract :
A Pt field emitter with two adjacent emission sites was fabricated by electron-beam induced deposition (EBID). The interference of electron waves in field emission from artificially fabricated two different points was observed for the first time. The observed interference fringes were well reproduced by the Young´s interference. These results draw a possibility of the new devices based on the interference of the coherent electrons in vacuum
Keywords :
electron beam deposition; electron field emission; platinum; Pt; electron wave interference; electron-beam induced deposition; field emission; field emitter; interference fringes; Annealing; Apertures; Carbon dioxide; Electromagnetic interference; Electron beams; Electron emission; Electron microscopy; Holography; Scanning electron microscopy; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335322
Filename :
4134447
Link To Document :
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