DocumentCode
2040116
Title
Development of an impedance monitoring system for the Hanbit device
Author
Sangyou Kim ; Taihyeop Lho ; Chung, Ki-Seok
Author_Institution
Dept. of Nucl. Eng., Hanyang Univ., Seoul, South Korea
fYear
2003
fDate
5-5 June 2003
Firstpage
476
Abstract
Summary form only given, as follows. The impedance monitoring system to make use of a voltage and current probe has been developed for the Hanbit Mirror device. The impedance monitoring system installed in the matching network and measured the whole impedance of the system including matching circuit, RF antenna and plasma. The Hanbit Device is typically operated during 100/spl sim/300 ms over 10/sup -4/ Torr. However, it is almost impossible to adjust the matching condition during the discharge. The impedance monitoring system is the fastest way to find the best power coupling condition and necessary to keep the consistent discharge in the modulated discharge. The system consists of the V-I probe and phase detection circuit. The impedance data from the phase information and measured reflected power can cast in the Smith Chart. In this presentation, the characteristics of the impedance monitoring system and the experimental data will be discussed.
Keywords
electric current measurement; electric impedance measurement; magnetic mirrors; plasma probes; voltage measurement; Hanbit mirror; RF antenna; Smith Chart; current probe; impedance monitoring system; matching circuit; matching network; modulated discharge; phase detection circuit; power coupling condition; voltage probe; Antenna measurements; Circuits; Impedance measurement; Mirrors; Monitoring; Plasma devices; Plasma measurements; Probes; Radio frequency; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location
Jeju, South Korea
ISSN
0730-9244
Print_ISBN
0-7803-7911-X
Type
conf
DOI
10.1109/PLASMA.2003.1230084
Filename
1230084
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