Title :
Self-learning signature analysis for non-volatile memory testing
Author :
Olivo, Piero ; Dalpasso, Marcello
Author_Institution :
Ist. di Ingegneria, Ferrara Univ., Italy
Abstract :
A new BIST scheme suitable for on-chip testing of non-volatile memories and based on signature analysis is presented. The signature of the whole memory, whose content can be selectively changed by the user, is dynamically self-learned by the memory and it is saved in a dedicated memory location. Such a signature can be externally compared with the expected one in order to check for the programming operation, or it can be used for self-test when data retention must be checked
Keywords :
automatic testing; built-in self test; error analysis; integrated circuit testing; integrated memory circuits; logic testing; BIST scheme; data retention checking; dedicated memory location; nonvolatile memory testing; onchip testing; programming operation checking; self-learning signature analysis; self-testing; Automatic testing; Built-in self-test; Circuit testing; Error correction; Error correction codes; Integrated circuit modeling; Logic programming; Nonvolatile memory; Performance evaluation; Power system reliability;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556975
