DocumentCode :
2040239
Title :
External electro-optic sampling for high-frequency electrical network analysis
Author :
Whitaker, John F. ; Frankel, Michael Y. ; Valdmanis, Janis A. ; Mourou, Gerard A.
Author_Institution :
University of Michigan
fYear :
1991
fDate :
22-26 Jul 1991
Firstpage :
20
Lastpage :
21
Keywords :
Electric variables measurement; Electrons; HEMTs; MODFETs; Optical waveguides; Sampling methods; Scattering parameters; Switches; Testing; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Spaceborne Photonics: Aerospace Applications of Lasers and Electro-Optics/Optical Millimeter-Wave Interactions: Measurements, Generation, Transmission and Control. LEOS 1991 Summer Topical Meetings on
Type :
conf
DOI :
10.1109/LEOSST.1991.665298
Filename :
665298
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2040239
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