DocumentCode
2040449
Title
A Wide Angle Achromatic Reflectron for the Atom Pprobe
Author
Panayi, P. ; Clifton, P.H. ; Lloyd, Grongar ; Shellswell, Graham ; Cerezo, A.
Author_Institution
Oxford Nanoscience Ltd.
fYear
2006
fDate
38899
Firstpage
63
Lastpage
63
Abstract
A new reflectron with increased effective angle of view, long flight path lengths, and has no chromatic aberration is developed. This reflectron achieve the advantages of a wide angle atom probe - such as fast data acquisition, low noise and a wide field of view - while retaining the advantages of a narrow angle reflectron based instrument
Keywords
mass spectrometers; atom probe; chromatic aberration; data acquisition; effective angle of view; field of view; flight path lengths; narrow angle reflectron based instrument; noise; wide angle achromatic reflectron; Aerospace materials; Atomic measurements; Degradation; Energy resolution; Instruments; Kilns; Mass spectroscopy; Probes; Shape; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location
Guilin
Print_ISBN
1-4244-0401-0
Type
conf
DOI
10.1109/IVNC.2006.335353
Filename
4134460
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