Title :
Scanning Atom-Probe Analysis of Carbon-Based Materials
Author :
Nishikawa, Osamu ; Taniguchi, Masahiro
Author_Institution :
Dept. of Chem. & Biol., Kanazawa Inst. of Technol.
Abstract :
A new type of atom probe named as the scanning atom probe was used to analyze the mass spectra of carbon nanotubes and some organic molecules
Keywords :
atom probe field ion microscopy; carbon nanotubes; mass spectroscopy; organic compounds; C; carbon nanotubes; carbon-based materials; mass spectra; organic molecules; scanning atom-probe analysis; Atomic measurements; Biochemical analysis; Biological materials; Chemistry; Electrodes; Hydrogen; Organic materials; Position sensitive particle detectors; Powders; Probes;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335355
