• DocumentCode
    2040592
  • Title

    Microwave and terahertz dielectric properties of single-crystalline scandate substrates for ferroic thin film deposition

  • Author

    Bovtun, V. ; Pashkov, V. ; Nuzhnyy, D. ; Kempa, Martin ; Goian, Veronica ; Molchanov, Vitaliy ; Poplavko, Yuriy ; Yakymenko, Yuriy ; Kamba, S.

  • Author_Institution
    Inst. of Phys., Prague, Czech Republic
  • fYear
    2013
  • fDate
    8-14 Sept. 2013
  • Firstpage
    646
  • Lastpage
    648
  • Abstract
    Single-crystalline (110) DyScO3 and (110) TbScO3 substrates were studied in microwave and THz ranges. Their inplane components of anisotropic dielectric parameters were measured from 10 K to 400 K. TE01d and HE11d resonances of the thin substrates were used for their microwave characterization. The microwave and THz parameters are consistent, show a strong dielectric anisotropy and pronounced temperature dependences. Use of the substrates in microwave applications is discussed.
  • Keywords
    anisotropic media; coating techniques; dysprosium compounds; microwave circuits; terbium compounds; thin films; DyScO3 substrates; DyScO3; TbScO3 substrates; TbScO3; anisotropic dielectric parameters; dielectric anisotropy; ferroic thin film deposition; microwave applications; microwave characterization; microwave properties; single-crystalline scandate substrates; terahertz dielectric properties; thin substrates; Dielectrics; Films; Microwave measurement; Permittivity; Physics; Substrates; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-966-335-395-1
  • Type

    conf

  • Filename
    6652995