DocumentCode :
2040725
Title :
Models for Variability of Transmission Line Structures
Author :
Stefanescu, Alexandra ; Ciuprina, Gabriela ; Ioan, Daniel ; Mihalache, D.
Author_Institution :
Electr. Eng. Dept., Politeh. Univ. of Bucharest, Bucharest
fYear :
2008
fDate :
12-15 May 2008
Firstpage :
1
Lastpage :
4
Abstract :
The paper is dedicated to the variability analysis of long interconnects, modeled as transmission lines. The subject deals with the numerical extraction of the parametric models for long interconnect. The novelty consists of the parameterization of the p.u.l. parameters of TL models w.r.t. the geometric parameters, subject to large or small variations. Examples of such variations are either due to design or technology (process or lithography), respectively. The accuracy of the simplest first order models is studied and validated experimentally for both affine and rational variability models.
Keywords :
integrated circuit interconnections; numerical analysis; transmission lines; long interconnect parametric models; numerical extraction; transmission line structures; variability analysis; Capacitance; Geometry; Integrated circuit interconnections; Lithography; Numerical models; Parametric statistics; Process design; Solid modeling; Taylor series; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
Conference_Location :
Avignon
Print_ISBN :
978-1-4244-2317-0
Electronic_ISBN :
978-1-4244-2318-7
Type :
conf
DOI :
10.1109/SPI.2008.4558402
Filename :
4558402
Link To Document :
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