Title :
2-π Crosstalk noise model for deep submicron VLSI global RC interconnects
Author :
Maheshwari, V. ; Anushree ; Mazumdar, Subhra ; Kar, Rajib ; Mandal, Durbadal ; Bhattacharjee, A.K.
Author_Institution :
Dept. of ECE, Hindustan Coll. of Sci. & Technol., Mathura, India
Abstract :
Noise estimation and avoidance are becoming very important issues in today´s high performance IC design. This paper presents a much improved, highly accurate and efficient noise model called 2-π model for the estimation of crosstalk noise. The proposed model incorporates all the physical properties including victim and aggressor drivers, distributed RC characteristics of interconnects and coupling locations of both victim and aggressor lines. Then with the help of this model, expressions for peak noise and noise width as well as sensitivity expressions to the various model parameters are calculated. We then use these sensitivity expressions to analyze and evaluate the effectiveness of various noise avoidance techniques for the reduction of this crosstalk noise.
Keywords :
RC circuits; VLSI; crosstalk; integrated circuit noise; interference suppression; aggressor lines; crosstalk noise model; crosstalk noise reduction; deep submicron VLSI global RC interconnects; distributed RC characteristics; high performance IC design; noise avoidance; noise estimation; noise width; peak noise; sensitivity expression; 2-π Crosstalk Noise Model; Crosstalk; Noise modelling; On-Chip RC Interconnect; VLSI;
Conference_Titel :
Electronics Design, Systems and Applications (ICEDSA), 2012 IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4673-2162-4
DOI :
10.1109/ICEDSA.2012.6507803