• DocumentCode
    2040950
  • Title

    Effect of Solder Joint Degradation on RF Impedance

  • Author

    Kwon, Daeil ; Azarian, Michael H. ; Pecht, Michael G.

  • Author_Institution
    Center for Adv. Life Cycle Eng. (CALCE), Maryland Univ., College Park, MD
  • fYear
    2008
  • fDate
    12-15 May 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This study demonstrates the value of RF impedance measurements as an early indicator of physical degradation of solder joints compared to DC resistance measurements. Mechanical fatigue tests have been conducted with an impedance-controlled circuit board on which a surface mount component was soldered. Simultaneous measurements were performed of DC resistance and the time domain reflection coefficient, as a measure of RF impedance, while the solder joints were stressed. The RF impedance was observed to increase in response to cracking of the solder joint while DC resistance remained constant. Failure analysis revealed that the RF impedance increase resulted from a physical crack initiated at the surface of the solder joint, which had propagated only partway across the solder joint.
  • Keywords
    cracks; electric impedance measurement; failure analysis; fatigue testing; reliability; solders; surface mount technology; time-domain reflectometry; DC resistance measurements; RF impedance measurements; failure analysis; impedance-controlled circuit board; mechanical fatigue tests; solder joint cracking; solder joint degradation effect; surface mount component; time domain reflection coefficient; Circuit testing; Degradation; Electrical resistance measurement; Impedance measurement; Radio frequency; Soldering; Stress measurement; Surface cracks; Surface impedance; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
  • Conference_Location
    Avignon
  • Print_ISBN
    978-1-4244-2317-0
  • Electronic_ISBN
    978-1-4244-2318-7
  • Type

    conf

  • DOI
    10.1109/SPI.2008.4558411
  • Filename
    4558411