Dynamic hysteresis in Finemet thin films

Author

Santi, L. ; Magni, A. ; Durin, G. ; Sommer, R.L. ; Colaiori, F. ; Zapperi, S.

Author_Institution

Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy

fYear

2003

fDate

March 30 2003-April 3 2003

Abstract

In this paper, we present a series of dynamic measurements on a set of Finemet thin films, having thickness ranging from 200 /spl Aring/ to 5 /spl mu/m, by using both magneto-optical Kerr effect (MOKE) and the fluxmetric inductive method. Unexpectedly, the data show two completely different hysteresis behavior, showing relevant differences in their frequency dependences. In particular, optical hysteresis is easily explained by a simple depinning model which can be solved analytically.

Keywords

Kerr magneto-optical effect; amorphous magnetic materials; boron alloys; copper alloys; ferromagnetic materials; iron alloys; magnetic hysteresis; magnetic thin films; niobium alloys; silicon alloys; 200 /spl Aring/ to 5 micron; FeCuNbSiB; amorphous magnetic materials; depinning model; dynamic hysteresis; finemet thin films; fluxmetric inductive method; frequency dependency; magneto-optical Kerr effect; optical hysteresis; Frequency dependence; Magnetic domain walls; Magnetic films; Magnetic hysteresis; Magnetic multilayers; Magnetooptic effects; Physics; Temperature; Thickness measurement; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Conference_Location

Boston, MA, USA

Print_ISBN

0-7803-7647-1

Type

conf

DOI

10.1109/INTMAG.2003.1230259

Filename

1230259