DocumentCode :
2041314
Title :
Surveillance Fma On A Semiconductor Laser Line - A Case Study
Author :
Heffner, William R.
Author_Institution :
AT&T Microelectronics
fYear :
1992
fDate :
16-19 Nov 1992
Firstpage :
573
Lastpage :
573
Keywords :
Certification; Computer aided software engineering; Condition monitoring; Costs; Laser modes; Microelectronics; Oceans; Production systems; Semiconductor lasers; Surveillance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN :
0-7803-0526-4
Type :
conf
DOI :
10.1109/LEOS.1992.694099
Filename :
694099
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2041314
