Title :
Calculation of near field microwave microscope based on the system «pin with a gap — short with hollow»
Author_Institution :
Balashovsky Inst. of the Saratov State Univ., Balashov, Russia
Abstract :
The article shows that the relation (1) allows drawing a calibration plot as a curve of reflection factor versus frequency in resonance vicinity for the near field microwave microscope based on the system "the pin with a gap - short with hollow". In order to perform calculations using this relation, three parameters of experimental curve such as curvature of the frequency characteristics, resonance frequency and reflection factor shall be kept at resonant frequency.
Keywords :
calibration; microwave resonators; reflection; calibration plot; near field microwave microscope calculation; reflection factor; resonance frequency characteristics; resonance vicinity; Dielectric materials; Educational institutions; Electronic mail; Microscopy; Microwave theory and techniques; Reflection; Resonant frequency;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-395-1
