DocumentCode
2041963
Title
Laser Assisted Atom Probe: Toward the Analyze of Non-Metallic Material
Author
Gilbert, M. ; Deconihout, B.
Author_Institution
CNRS, Rouen Univ., Mont Saint Aignan
fYear
2006
fDate
38899
Firstpage
189
Lastpage
189
Abstract
Laser assisted atom probe technique is reported which differs from the conventional atom probe analysis in the use of ultra fast sub nanosecond laser pulses instead of electrical evaporation pulsed. This method proves to be advantageous in analyzing oxide type materials like manganites, superconductors and even in the conducting phase of highly resistant silicon
Keywords
atom probe field ion microscopy; laser materials processing; conducting phase; highly resistant silicon; laser assisted atom probe; manganites; oxides; superconductors; ultra fast sub nanosecond laser pulses; Atom lasers; Atomic beams; Conducting materials; Optical materials; Optical pulses; Probes; Resistance; Silicon; Superconducting materials; Superconductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location
Guilin
Print_ISBN
1-4244-0401-0
Type
conf
DOI
10.1109/IVNC.2006.335422
Filename
4134524
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