• DocumentCode
    2042050
  • Title

    Development of thermal fatigue sensor for electrical and electronic equipment

  • Author

    Minakata, Y. ; Qiuang Yu ; Takagi, Kazuyoshi

  • Author_Institution
    Yokohama Nat. Univ., Yokohama, Japan
  • fYear
    2012
  • fDate
    13-16 Dec. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In this paper, authors proposed an original sensor which can measure thermal fatigue life of electronic equipment. The measurement principle of the sensor is that the joint was damaged by the stress due to a mismatch of thermal expansion between two materials. Finally, the joint was ruptured by the repeated stress. The priority subject was the feasibility of measurement accuracy of the sensor. Generally, a high level control of failure in joint is very difficult. To solve this problem, authors conceived the original design of the sensor. Then, the availability study of the original sensor for fracture control in joint was carried out using the crack propagation analysis. In the result, a high level control method for failure in joint of the sensor was achieved.
  • Keywords
    cracks; failure analysis; fracture; temperature sensors; thermal expansion; thermal stress cracking; crack propagation analysis; electrical equipment; electronic equipment; failure analysis; fracture control; high level control method; repeated stress; thermal expansion; thermal fatigue life measurement; thermal fatigue sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
  • Conference_Location
    Lantau Island
  • Print_ISBN
    978-1-4673-4945-1
  • Electronic_ISBN
    978-1-4673-4943-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2012.6507847
  • Filename
    6507847