DocumentCode
2042050
Title
Development of thermal fatigue sensor for electrical and electronic equipment
Author
Minakata, Y. ; Qiuang Yu ; Takagi, Kazuyoshi
Author_Institution
Yokohama Nat. Univ., Yokohama, Japan
fYear
2012
fDate
13-16 Dec. 2012
Firstpage
1
Lastpage
5
Abstract
In this paper, authors proposed an original sensor which can measure thermal fatigue life of electronic equipment. The measurement principle of the sensor is that the joint was damaged by the stress due to a mismatch of thermal expansion between two materials. Finally, the joint was ruptured by the repeated stress. The priority subject was the feasibility of measurement accuracy of the sensor. Generally, a high level control of failure in joint is very difficult. To solve this problem, authors conceived the original design of the sensor. Then, the availability study of the original sensor for fracture control in joint was carried out using the crack propagation analysis. In the result, a high level control method for failure in joint of the sensor was achieved.
Keywords
cracks; failure analysis; fracture; temperature sensors; thermal expansion; thermal stress cracking; crack propagation analysis; electrical equipment; electronic equipment; failure analysis; fracture control; high level control method; repeated stress; thermal expansion; thermal fatigue life measurement; thermal fatigue sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location
Lantau Island
Print_ISBN
978-1-4673-4945-1
Electronic_ISBN
978-1-4673-4943-7
Type
conf
DOI
10.1109/EMAP.2012.6507847
Filename
6507847
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