Title :
A theoretical approach for solving the post-fabrication tuning problem
Author :
Chang, V.W.W. ; Liu, P.C.K. ; Li, K.C.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Abstract :
Post-fabrication tuning is always necessary in electrical circuits manufacturing to achieve a high percentage yield. Tuning can give good yield at low cost only if the suitable tuning parameters are identified. In this paper, a theoretical approach is proposed to identify those tuning parameters. The approach is implemented in an example and the results match with the predication.<>
Keywords :
network analysis; sensitivity analysis; electrical circuits manufacturing; high percentage yield; post-fabrication tuning problem; Circuit optimization; Fabrication; Sensitivity analysis; Statistical distributions;
Conference_Titel :
TENCON '93. Proceedings. Computer, Communication, Control and Power Engineering.1993 IEEE Region 10 Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-1233-3
DOI :
10.1109/TENCON.1993.320213
