Testability features for a submicron voice-coder ASIC

Author

Pichon, F.

Author_Institution

Common Tech. & Technol. Unit, Thomson-CSF Commun., Gennevilliers, France

fYear

1996

fDate

20-25 Oct 1996

Firstpage

377

Lastpage

385

Abstract

This paper describes the design and implementation of test functions on an ASIC integrating a digital-signal processor core. This chip performs voice coding functions for military and professional mobile communication systems. The principal topics of this paper are: general presentation of the chip architecture, test methodology, test architecture, special test modes, built-in self-test scheme, IEEE 1149.1 implementation, and test design methodology. The proposed test strategy is relevant for processor core based submicron ICs

Keywords

IEEE standards; application specific integrated circuits; built-in self test; computer architecture; computer testing; design for testability; digital signal processing chips; integrated circuit testing; measurement standards; military equipment; mobile communication; vocoders; IEEE 1149.1; built-in self-test; digital-signal processor core; military mobile communication systems; professional mobile communication systems; submicron IC; submicron voice-coder ASIC; test design; test strategy; voice coding; Application specific integrated circuits; Automatic testing; CMOS technology; Clocks; Coprocessors; Digital signal processing; Military communication; Mobile communication; Read only memory; Signal processing algorithms;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.556984

Filename

556984