Title :
Langevin micromagnetic simulation and MOKE measurements of vortex formation as a function of thickness in submicron patterned permalloy thin films
Author_Institution :
R&D, Micron Technol. Inc., Boise, ID, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, Langevin micromagnetic simulation and MOKE measurements of vortex formation as a function of thickness in submicron patterned permalloy thin films have been investigated.
Keywords :
Kerr magneto-optical effect; Permalloy; magnetic hysteresis; magnetic thin films; micromagnetics; vortices; Langevin micromagnetic simulation; MOKE; permalloy thin films; vortex formation; Fluctuations; Magnetic hysteresis; Magnetosphere; Micromagnetics; Probability distribution; Read only memory; Shape; Tail; Thickness measurement; Transistors;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230307
