DocumentCode
2042544
Title
Langevin micromagnetic simulation and MOKE measurements of vortex formation as a function of thickness in submicron patterned permalloy thin films
Author
Deak, J.G.
Author_Institution
R&D, Micron Technol. Inc., Boise, ID, USA
fYear
2003
fDate
March 30 2003-April 3 2003
Abstract
In this paper, Langevin micromagnetic simulation and MOKE measurements of vortex formation as a function of thickness in submicron patterned permalloy thin films have been investigated.
Keywords
Kerr magneto-optical effect; Permalloy; magnetic hysteresis; magnetic thin films; micromagnetics; vortices; Langevin micromagnetic simulation; MOKE; permalloy thin films; vortex formation; Fluctuations; Magnetic hysteresis; Magnetosphere; Micromagnetics; Probability distribution; Read only memory; Shape; Tail; Thickness measurement; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7647-1
Type
conf
DOI
10.1109/INTMAG.2003.1230307
Filename
1230307
Link To Document