• DocumentCode
    2042837
  • Title

    Effects of molding compounds on warpage and damage of PBGA after post mold cure

  • Author

    Lam, T.M. ; Sung Yi

  • Author_Institution
    Mech. & Mater. Eng. Dept., Portland State Univ., Portland, OR, USA
  • fYear
    2012
  • fDate
    13-16 Dec. 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In the present study, governing damage mechanisms after post mold cure (PMC) for plastic ball grid array (PBGA) packages have been evaluated by a three-dimensional (3-D) thermo-viscoelastic finite element method. The parametric studies for the PBGA package with various molding compounds have been performed. A wide range of the modulus (1 MPa~15 GPa) and the coefficient of thermal expansion (CTE) (10 ppm~300 ppm) is evaluated to see feasibility of a new class of material set in the molding compound. Effects of thermo-mechanical properties of selected molding compound on the warpage and residual stress of the PBGA package are analyzed. Classification of modes of deformation in the BGA package with material sets will shed light on novel material development for better reliability. In addition, the optimum thermo-mechanical properties of molding compounds will be selected based on the parametric studies.
  • Keywords
    ball grid arrays; deformation; finite element analysis; internal stresses; moulding; plastic packaging; reliability; thermal expansion; viscoelasticity; 3D thermoviscoelastic finite element method; CTE; PBGA damage; PMC; coefficient of thermal expansion; deformation mode classification; governing damage mechanisms; plastic ball grid array packages; post mold cure; reliability; residual stress; three-dimensional thermoviscoelastic finite element method; warpage molding compound effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
  • Conference_Location
    Lantau Island
  • Print_ISBN
    978-1-4673-4945-1
  • Electronic_ISBN
    978-1-4673-4943-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2012.6507877
  • Filename
    6507877