Title :
Thermionic cooling of optoelectronic and microelectronic devices
Author :
Lee, S.P. ; Lough, B.C. ; Lewis, R.A. ; Zhang, C.
Author_Institution :
Dept. of Eng. Phys., Wollongong Univ., NSW, Australia
Abstract :
Solid-state thermionic cooling has gained attention recently because of its potential high cooling power. Thermionic devices based on semiconductor heterostructures utilize the band-edge offset at a heterojunction as the thermionic emission potential barrier and a thin layer to separate the cold and hot junction. In this paper, we present the behavior of thermionic coolers with periodic barriers using gallium arsenide/aluminium gallium arsenide (GaAs/AlxGa1-xAs) semiconductor heterostructures. The exact numerical calculation to model the device performance has shown that the thermal efficiency in a multilayer structure is optimised when the effect of phonon scattering is introduced in the model. Besides, the thermal efficiency depends critically on applied bias.
Keywords :
III-V semiconductors; aluminium compounds; cooling; digital simulation; gallium arsenide; optoelectronic devices; semiconductor device models; semiconductor heterojunctions; thermionic electron emission; GaAs-AlxGa1-xAs; GaAs/AlxGa1-xAs; applied bias dependence; device design; device performance model; exact numerical calculation; heterojunction band-edge offset; microelectronic devices; multilayer structure; numerical simulation; optoelectronic devices; periodic barriers; phonon scattering; semiconductor heterostructures; solid-state thermionic cooling; thermal efficiency; thermionic emission potential barrier; Aluminum; Cooling; Gallium arsenide; Heterojunctions; Microelectronics; Nonhomogeneous media; Numerical models; Phonons; Solid state circuits; Thermionic emission;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2000. COMMAD 2000. Proceedings Conference on
Print_ISBN :
0-7803-6698-0
DOI :
10.1109/COMMAD.2000.1022978